US Patent Issued to Qcify on April 15 for "Automated inspection data collection for machine learning applications" (Belgian, American Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,278,940, issued on April 15, was assigned to Qcify Inc. (San Mateo, Calif.).

"Automated inspection data collection for machine learning applications" was invented by Raf Peeters (San Mateo, Calif.), Antoon De Cleen (Diest, Belgium), Pieter Ieven (Genk, Belgium) and Ruben Praets (Leopoldsburg, Belgium).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method includes collecting measurement data of a sample, determining a confidence value associated with the measurement data, determining if the confidence value is less than a confidence threshold value, and causing the measurement data to be stored in a memory device if the confidence value is less than the ...