ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,442,706, issued on Oct. 14, was assigned to Q'z Corp. (Kodaira, Japan).
"Diaphragm pressure gauge and compound pressure gauge" was invented by Hisao Hojoh (Musashino, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A diaphragm pressure gauge includes: a structure disposed under pressure to be measured; two diaphragms attached to the structure so as to oppose each other; and a detection element that is fixed to the two diaphragms to detect displacements of the two diaphragms. In each of the two diaphragms, when one of two surfaces is designated an opposing surface and the other surface is designated a non-opposing surface, the structure and the two ...