ALEXANDRIA, Va., Nov. 18 -- United States Patent no. 12,471,861, issued on Nov. 18, was assigned to Purdue Research Foundation (West Lafayette, Ind.).
"Metallic bone measurement system and method" was invented by Aaron James Specht (West Lafayette, Ind.) and Linda H. Nie (West Lafayette, Ind.).
According to the abstract* released by the U.S. Patent & Trademark Office: "The bone measurement system is configured to detect a density of a metallic source within a bone. The bone measurement system includes an x-ray fluorescence (XRF) device, a filter, a radiation detector, a non-transitory computer-readable storage medium storing processor-executable instructions, and a processor. The XRF device may have an x-ray tube including an x-ray source...