US Patent Issued to Protochips on April 22 for "Automated application of drift correction to sample studied under electron microscope" (North Carolina Inventors)

ALEXANDRIA, Va., June 6 -- United States Patent no. 12,284,445, issued on April 22, was assigned to Protochips Inc. (Morrisville, N.C.).

"Automated application of drift correction to sample studied under electron microscope" was invented by Franklin Stampley Walden II (Raleigh, N.C.), John Damiano Jr. (Holly Springs, N.C.), David P. Nackashi (Raleigh, N.C.), Daniel Stephen Gardiner (Wake Forest, N.C.), Mark Uebel (Morrisville, N.C.), Alan Philip Franks (Durham, N.C.), Benjamin Jacobs (Apex, N.C.), Joshua Brian Friend (Raleigh, N.C.), Katherine Elizabeth Marusak (Cary, N.C.), Nelson L. Marthe Jr. (Cary, N.C.) and Benjamin Bradshaw Larson (Cary, N.C.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Methods and s...