ALEXANDRIA, Va., Sept. 10 -- United States Patent no. 12,411,097, issued on Sept. 9, was assigned to PROTO PATENTS LTD. (LaSalle, Canada).
"Laue measurement system with turntable and method of operating the same" was invented by Mohammed Belassel (LaSalle, Canada) and Kenneth Raymond Geauvreau (LaSalle, Canada).
According to the abstract* released by the U.S. Patent & Trademark Office: "An X-ray diffraction apparatus for measuring crystal orientation of crystalline samples is provided. The apparatus comprises a turntable comprising at least one tray; a turntable support platform defining a plane; and a motorized turntable displacement system for remotely displacing the turntable linearly along a first axis parallel to the plane, linearly ...