ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,461,143, issued on Nov. 4, was assigned to PROTEANTECS LTD. (Haifa, Israel).
"Integrated circuit margin measurement" was invented by Eyal Fayneh (Givatayim, Israel), Yahel David (Kibbutz Gazit, Israel) and Evelyn Landman (Haifa, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "Failure risk measurement in a semiconductor Integrated Circuit (IC) by generating a pulse of a preset time duration on an output path when a signal from a data path and/or control logic circuit of the semiconductor IC changes. The data paths and/or control logic circuits of the semiconductor IC have a common clock. The output paths may be combined to provide a combined output ...