ALEXANDRIA, Va., June 6 -- United States Patent no. 12,282,058, issued on April 22, was assigned to PROTEANTECS LTD. (Haifa, Israel).
"Integrated circuit pad failure detection" was invented by Eyal Fayneh (Givatayim, Israel), Shai Cohen (Haifa, Israel), Evelyn Landman (Haifa, Israel), Yahel David (Kibbutz Gazit, Israel) and Inbar Weintrob (Givat-Ada, Israel).
According to the abstract* released by the U.S. Patent & Trademark Office: "A semiconductor integrated circuit (IC) comprising a time-to-digital converter (TDC) configured to measure an input-to-output delay of an I/O buffer of a pad the IC, the measured delay reflecting a connection impedance of the pad. A circuit in the IC, or a computer in communication with the IC, determines ele...