ALEXANDRIA, Va., Aug. 6 -- United States Patent no. 12,380,306, issued on Aug. 5, was assigned to PPG Industries Ohio Inc. (Cleveland).
"Method of detecting a concealed pattern" was invented by Nicolas B. Duarte (Allison Park, Pa.), Zachary J. Brown (Austin, Texas), Juan F. Choreno (Zumpango, Mexico), Julian M. Galvan-Miyoshi (Texcoco, Mexico), Darin W. Laird (Pittsburgh), Alejandro Morones Dobarganes (Tepexpan, Mexico), Jose Alberto Olivares Lecona (Mexico City), Stuart D. Hellring (Pittsburgh) and Michael A. Zalich (Wexford, Pa.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A method for detecting a component including a concealed pattern includes: detecting infrared electromagnetic radiation reflected or ...