ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,812, issued on Feb. 10, was assigned to POINT ENGINEERING Co. LTD. (Chungcheongnam-do, South Korea).
"Test device capable of testing micro LED and manufacturing method thereof" was invented by Bum Mo Ahn (Gyeonggi-do, South Korea), Seung Ho Park (Gyeonggi-do, South Korea) and Young Heum Eom (Gyeonggi-do, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "Proposed are a test device and a manufacturing method of the test device capable of testing a test object that is provided with an electrode which has a size and/or a pitch distance ranging from 1 to 100 micrometers (micro metre)."
The patent was filed on Oct. 11, 2023, under Application No...