ALEXANDRIA, Va., June 17 -- United States Patent no. 12,313,479, issued on May 27, was assigned to Piezo-Metrics Inc (Simi Valley, Calif.).

"Semiconductor strain gage" was invented by Franklin Curtis Wong (Simi Valley, Calif.), Robert Andrew Mueller (Simi Valley, Calif.), Kimberly Lakea Harrison (Martinez, Calif.), Farzad Khademolhosseini (Burlingame, Calif.) and Carolyn D. Bianco (San Francisco).

According to the abstract* released by the U.S. Patent & Trademark Office: "Strain gages in accordance with the present disclosure are sculpted from a device layer of a semiconductor-on-insulator wafer using deep reactive ion etching, yielding very good control over the electrical properties and physical dimensions of the strain gages. In some e...