US Patent Issued to Pictometry International on Nov. 25 for "Systems and methods for automated detection of changes in extent of structures using imagery" (New York, Washington Inventors)

ALEXANDRIA, Va., Nov. 25 -- United States Patent no. 12,482,117, issued on Nov. 25, was assigned to Pictometry International Corp. (Rochester, N.Y.).

"Systems and methods for automated detection of changes in extent of structures using imagery" was invented by Stephen Ng (Rochester, N.Y.), David R. Nilosek (Rochester, N.Y.), Phillip Salvaggio (Rochester, N.Y.) and Shadrian Strong (Bellevue, Wash.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Systems and methods for automated detection of changes in extent of structures using imagery are disclosed, including a non-transitory computer readable medium storing computer executable code that when executed by a processor cause the processor to: align an outline of...