US Patent Issued to Photothermal Spectroscopy on Sept. 2 for "Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy" (California Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,215, issued on Sept. 2, was assigned to Photothermal Spectroscopy Corp. (Santa Barbara, Calif.).

"Asymmetric quadrature interferometry for thin film interference suppression in optical photothermal infrared spectroscopy" was invented by Craig Prater (Santa Barbara, Calif.), Derek Decker (Carmel, Calif.) and David Grigg (Santa Barbara, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Asymmetric interferometry is used with various embodiments of Optical Photothermal Infrared (OPTIR) systems to suppress thin film interference effects."

The patent was filed on April 14, 2023, under Application No. 18/300,858.

*For further information, including i...