US Patent Issued to Photonic Edge on March 25 for "Electromagnetic wave measuring apparatus and electromagnetic wave measuring method" (Japanese Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,279, issued on March 25, was assigned to Photonic Edge Inc. (Gifu, Japan).

"Electromagnetic wave measuring apparatus and electromagnetic wave measuring method" was invented by Kota Nishimura (Gifu, Japan), Takeshi Sugiyama (Gifu, Japan) and Shintaro Hisatake (Gifu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An electromagnetic wave measuring apparatus includes: a light source unit configured to output a first laser beam whose frequency is settable, and a second laser beam; an electro-optic probe configured to receive the first laser beam of a frequency that is set in the frequency range, the second laser beam, and a detection-target electr...