US Patent Issued to Peking University on April 15 for "Defect location method and device based on coverage information" (Chinese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,277,486, issued on April 15, was assigned to Peking University (Beijing).

"Defect location method and device based on coverage information" was invented by Lu Zhang (Beijing), Yiling Lou (Beijing), Qihao Zhu (Beijing), Jinhao Dong (Beijing), Zeyu Sun (Beijing) and Dan Hao (Beijing).

According to the abstract* released by the U.S. Patent & Trademark Office: "The present disclosure discloses a defect location method and device based on coverage information, the method including: characterizing program structure information and test case coverage information of a target program in a graph to obtain a graph-characterized structure; generating a node attribute sequence and an adjacency mat...