US Patent Issued to PARTICLE MEASURING SYSTEMS on June 10 for "Enhanced dual-pass and multi-pass particle detection" (Colorado Inventors)

ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,393, issued on June 10, was assigned to PARTICLE MEASURING SYSTEMS INC. (Boulder, Colo.).

"Enhanced dual-pass and multi-pass particle detection" was invented by Mehran Vahdani Moghaddam (Boulder, Colo.), Brian A. Knollenberg (Boulder, Colo.) and Dwight Sehler (Boulder, Colo.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A particle detection system may include a light source, a first beam splitter, a particle interrogation zone, a reflecting surface, a second beam splitter, a first photodetector, and a second photodetector. The first beam splitter may be configured to split the source beam into an interrogation beam and a reference beam. The particl...