US Patent Issued to PARTICLE MEASURING SYSTEMS on Aug. 26 for "System and method for particles measurement" (Israeli, American Inventors)

ALEXANDRIA, Va., Aug. 26 -- United States Patent no. 12,399,102, issued on Aug. 26, was assigned to PARTICLE MEASURING SYSTEMS INC. (Boulder, Colo.).

"System and method for particles measurement" was invented by Nir Karasikov (Haifa, Israel), Ori Weinstein (Haifa, Israel), Shoam Shwartz (Haifa, Israel), Mehran Vahdani Moghaddam (Boulder, Colo.) and Uri Dubin (Haifa, Israel).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical system for particle size and concentration analysis, includes: at least one laser that produces an illuminating beam; a focusing lens that focuses the illuminating beam on particles that move relative to the illuminating beam at known or pre-defined angles to the illuminating beam t...