ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,469,158, issued on Nov. 11, was assigned to Panasonic Intellectual Property Management Co. Ltd. (Osaka, Japan).
"Measurement device and measurement method" was invented by Ken Hatsuda (Kyoto, Japan), Masamitsu Murase (Kyoto, Japan) and Riku Matsumoto (Hyogo, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A measurement device includes: an imager that captures a target including a pallet and a load, the pallet including a reference target; an image processing unit that extracts a specific region in each of the reference target and a region of the load based on image data of the target; and a calculator that acquires first coordinate information indi...