US Patent Issued to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT on May 20 for "Inspection method and inspection apparatus" (Japanese Inventor)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,309,499, issued on May 20, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).

"Inspection method and inspection apparatus" was invented by Shinya Nakashima (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes an illumination device capable of emitting first light in a first wavelength band reference light in a reference wavelength band overlapping with the first wavelength band, an imaging device that images an inspection body and outputs a pixel signal, and an image processing device. The illumination device emits the first light and the reference light to the inspection body at ...