US Patent Issued to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT on March 11 for "Inspection method and inspection machine" (Japanese Inventor)

ALEXANDRIA, Va., March 12 -- United States Patent no. 12,249,058, issued on March 11, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).

"Inspection method and inspection machine" was invented by Shinya Nakashima (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection machine includes image sensors that image a sheet, a lighting device that irradiates the sheet with light, and an image processing device that generates an image of an object from outputs of the image sensors. The image processing device generates captured images that include an image in a predetermined range of the sheet in common based on the outputs from the image sensors. The image process...