ALEXANDRIA, Va., June 18 -- United States Patent no. 12,326,399, issued on June 10, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).

"Inspection method and inspection system" was invented by Takanobu Ojima (Osaka, Japan), Hideto Motomura (Kyoto, Japan), Rina Akaho (Osaka, Japan) and Yoshinori Matsui (Nara, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "Provided are an inspection method, a program, and an inspection system capable of improving accuracy of inspecting a color of a surface of an object. The inspection method includes acquisition step and comparison step. Acquisition step is a step of acquiring a target image of a surface of an object obtained by an imagin...