US Patent Issued to Panasonic Intellectual Property Management on Feb. 10 for "Impurity detection support device and impurity detection support method" (Japanese Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,546,735, issued on Feb. 10, was assigned to Panasonic Intellectual Property Management Co. Ltd. (Osaka, Japan).

"Impurity detection support device and impurity detection support method" was invented by Miyuki Nakai (Osaka, Japan), Yuko Ogawa (Osaka, Japan) and Toshiro Kume (Hyogo, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An impurity detection support device includes: a pipe in which a liquid under test flows; a first electrode and a second electrode provided in the pipe, the first electrode and the second electrode being arranged such that an AC voltage is adapted to be applied to or an AC current is adapted to be superimposed on the liquid ...