US Patent Issued to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT on Aug. 12 for "Inspection method and inspection apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Aug. 12 -- United States Patent no. 12,387,314, issued on Aug. 12, was assigned to PANASONIC INTELLECTUAL PROPERTY MANAGEMENT Co. LTD. (Osaka, Japan).

"Inspection method and inspection apparatus" was invented by Shinya Nakashima (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection apparatus includes an image sensor including a first imaging region and a reference imaging region. The first imaging region includes first pixels which capture an image of an object in a first wavelength band output first feature quantities each of which corresponds to one of first pixels. The reference imaging region includes reference pixels which capture an image of the object in a referen...