ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,405, issued on March 25, was assigned to PAMTEK Co. Ltd. (Hwaseong-do, South Korea).
"Adjustment control device for precise measurement" was invented by Jae Woong Kim (Hwaseong-si, South Korea), Jung In Park (Hwaseong-si, South Korea), Sung Gu Kim (Hwaseong-si, South Korea) and Hee Tae Kim (Hwaseong-si, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "An adjustment control device for precise measurement that controls an inspection equipment for inspecting an inspected object to perform precise measurement includes a lowering control unit that lowers the inspection equipment with respect to the inspected object, a rotation control unit tha...