US Patent Issued to Packaging Technologies & Inspection on March 25 for "System and method for dynamic signal processing for vacuum decay leak detection" (New York Inventors)

ALEXANDRIA, Va., March 26 -- United States Patent no. 12,259,301, issued on March 25, was assigned to Packaging Technologies & Inspection LLC (Hawthorne, N.Y.).

"System and method for dynamic signal processing for vacuum decay leak detection" was invented by Mikhail Kneller (Bronx, N.Y.) and Guerney Hunt (Yonkers, N.Y.).

According to the abstract* released by the U.S. Patent & Trademark Office: "A leak detection apparatus includes a test chamber and a vacuum source connected to the test chamber via a pneumatic line. A first pressure transducer is in communication with the test chamber. A controller is configured to collect and analyze data generated by the first pressure transducer at a predetermined frequency throughout an entire test cy...