ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,327, issued on May 13, was assigned to Oxford Instruments Asylum Research Inc. (Goleta, Calif.), Ecole Normale Suerieure de Lyon (Lyons, France), Universite Claude Bernanrd Lyon 1 (Lyons, France) and Centre National de la Recherche Scientifique (Paris).
"Atomic force microscope" was invented by Aleks Labuda (Santa Barbara, Calif.), Basile Pottier (Lyons, France) and Ludovic Bellon (Le Bois-d'Oingt, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "An atomic force microscope ("AFM") based interferometer, uses a light source, and a splitting optical interface, splitting the light beam into a signal light beam and a reference light beam. Both the s...