US Patent Issued to OSRAM Opto Semiconductors on Jan. 20 for "Optoelectronic measuring device for measuring the intensity of electromagnetic radiation in a frequency-resolved manner" (German Inventor)

ALEXANDRIA, Va., Jan. 20 -- United States Patent no. 12,529,597, issued on Jan. 20, was assigned to OSRAM Opto Semiconductors GmbH (Regensburg, Germany).

"Optoelectronic measuring device for measuring the intensity of electromagnetic radiation in a frequency-resolved manner" was invented by Sergey Kudaev (Regensburg, Germany).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optoelectronic measuring device may be used for the frequency-resolved measurement of an intensity of electromagnetic radiation. The device may include a plurality of measurement channels. A first of the measurement channels may have a first spectral sensitivity, and a further of the measurement channels may have a further spectral sensit...