US Patent Issued to Oracle International on Feb. 3 for "Point-in-time relative outlier detection" (American, Spanish Inventors)

ALEXANDRIA, Va., Feb. 3 -- United States Patent no. 12,542,793, issued on Feb. 3, was assigned to Oracle International Corp. (Redwood Shores, Calif.).

"Point-in-time relative outlier detection" was invented by Diego Ceferino Torres Dho (Barcelona, Spain), Chieh Ting Yeh (Austin, Texas), Yufei Liu (San Jose, Calif.) and May Bich Nhi Lam (San Jose, Calif.).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for performing point-in-time relative outlier detection are disclosed herein. In some embodiments, an outlier detection system analyzes metric data based on (a) the values of the metric data detected on a computing resource, (b) a relative change between different metric readings and/or (c) an absolute...