US Patent Issued to Oracle International on Feb. 10 for "Run-time modification of data monitoring platform metrics" (British Inventors)

ALEXANDRIA, Va., Feb. 11 -- United States Patent no. 12,547,515, issued on Feb. 10, was assigned to Oracle International Corp. (Redwood Shores, Calif.).

"Run-time modification of data monitoring platform metrics" was invented by Vivian Qian Lee (Berkshire, Great Britain) and Hugo Alexandre Pereira Monteiro (London).

According to the abstract* released by the U.S. Patent & Trademark Office: "Techniques for creating a custom metric type to be added to a set of metrics generated by a data monitoring platform at run-time are disclosed. A system receives values defining properties of a custom metric type based on a custom metric template and a custom schema template. The system generates an instruction set, based on the values associated with ...