ALEXANDRIA, Va., April 9 -- United States Patent no. 12,272,044, issued on April 8, was assigned to Optum Inc. (Minnetonka, Minn.).
"Production line conformance measurement techniques using categorical validation machine learning models" was invented by Thomas R. Gilbertson (Hartford, Conn.), Raja Mukherji (Dublin), Haylea Tricia Northcott (Simsbury, Conn.), Karen Harte (Avon, Conn.) and Colby A. Wright (Chandler, Ariz.).
According to the abstract* released by the U.S. Patent & Trademark Office: "Various embodiments of the present invention provide methods, apparatus, systems, computing devices, computing entities, and/or the like for production line conformance monitoring. For example, certain embodiments of the present invention utilize...