ALEXANDRIA, Va., June 19 -- United States Patent no. 12,333,864, issued on June 17, was assigned to Online Development Inc. (Knoxville, Tenn.).
"Machine function analysis with radar plot" was invented by Keith A. Walton (Jonesborough, Tenn.) and Kai T. Bouse (Loudon, Tenn.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A system and method for detecting abnormal operating conditions in a machine through the analysis and comparison of radar areas after the transformation of waveform data collected from machine parts. An example embodiment is configured to: generate a monitoring signal in response to the behavior of a machine while the machine is in operation; simultaneously monitor two or more spectrums in the...