ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,742, issued on Sept. 30, was assigned to OMRON Corp. (Kyoto, Japan).
"Inspection system and inspection method" was invented by Yasuyuki Ikeda (Kyoto, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "An inspection system includes: a light emitting device configured to illuminate a target object; a collimator lens arranged between the light emitting device and the target object; and an imaging device configured to image the target object. The light emitting device is capable of changing a light emission position. The inspection system further includes an image analysis unit configured to generate an analysis image in which a value of each pixel c...