US Patent Issued to OMRON on Sept. 30 for "Image inspection device, image inspection method, and prelearned model generation device" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 30 -- United States Patent no. 12,430,748, issued on Sept. 30, was assigned to OMRON Corp. (Kyoto, Japan).

"Image inspection device, image inspection method, and prelearned model generation device" was invented by Yasuyuki Ikeda (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An image inspection device includes: a divided image generation part for inputting a divided inspection image obtained by dividing an image of an inspection object and a surrounding-containing image that includes an image based on at least some of the surrounding images of the divided inspection image to a prelearned model having been trained so as to accept as inputs a divided good-article image obta...