US Patent Issued to OMRON on Sept. 2 for "Abnormality detector apparatus and method for detecting abnormal state of rotary machine such as motor" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 3 -- United States Patent no. 12,405,307, issued on Sept. 2, was assigned to OMRON Corp. (Kyoto, Japan).

"Abnormality detector apparatus and method for detecting abnormal state of rotary machine such as motor" was invented by Takahiro Sato (Kyoto, Japan), Keisuke Yano (Kyoto, Japan) and Takahiro Nakamura (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "In an abnormality detector apparatus, a signal processor unit performs frequency analysis on data of a current or a voltage in different first and second time intervals to retrieve a first drive frequency corresponding to a maximum peak value of a spectrum in the first time interval and a second drive frequency corresponding ...