ALEXANDRIA, Va., Oct. 21 -- United States Patent no. 12,443,179, issued on Oct. 14, was assigned to OMRON Corp. (Kyoto, Japan).

"Control device and control method for maintaining the production of product with stable quality" was invented by Takaki Nakai (Kyoto, Japan) and Isamu Namose (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "A control method includes: monitoring a statistic obtained by performing a multivariate analysis on a plurality of parameters; extracting, from the plurality of parameters, a predetermined number of higher-order parameters in terms of an influence degree on fluctuation of the statistic; generating a plurality of experimental patterns according to an experimental desi...