US Patent Issued to OMRON on May 27 for "Cheating estimation device, cheating estimation method, and recording medium" (Japanese Inventors)

ALEXANDRIA, Va., June 17 -- United States Patent no. 12,315,394, issued on May 27, was assigned to OMRON Corp. (Kyoto, Japan).

"Cheating estimation device, cheating estimation method, and recording medium" was invented by Sakuya Araki (Muko, Japan), Yoshihiro Hirai (Muko, Japan), Yusuke Akino (Muko, Japan) and Hirofumi Ota (Muko, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The disclosure provides a cheating estimation device including an answer acquisition part acquires a character string input into an answer column of a question as an answer; an operation history information acquisition part acquires operation history information indicating an operation history of an input operation of the answer t...