US Patent Issued to OMRON on May 20 for "Optical assembly for three-dimensional measurement device and three-dimensional measurement device equipped with same" (Japanese Inventors)

ALEXANDRIA, Va., June 16 -- United States Patent no. 12,306,456, issued on May 20, was assigned to OMRON Corp. (Kyoto, Japan).

"Optical assembly for three-dimensional measurement device and three-dimensional measurement device equipped with same" was invented by Takeshi Inoda (Kyoto, Japan), Tomonori Ariyoshi (Kyoto, Japan), Hitoshi Nakatsuka (Kyoto, Japan), Motoharu Okuno (Kyoto, Japan), Shinya Matsumoto (Kyoto, Japan), Jun Ota (Kyoto, Japan) and Tetsuya Kiguchi (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An optical assembly (13) for a three-dimensional measurement device is equipped with: an optical lens (320) that forms a pair of conjugate planes having an optically conjugate relationship...