US Patent Issued to OMRON on May 13 for "Temperature threshold determining device, temperature abnormality determining system, temperature threshold determining method" (Japanese Inventors)

ALEXANDRIA, Va., June 12 -- United States Patent no. 12,298,190, issued on May 13, was assigned to OMRON Corp. (Kyoto, Japan).

"Temperature threshold determining device, temperature abnormality determining system, temperature threshold determining method" was invented by Takahiro Nakamura (Ritto, Japan), Ryo Ikeuchi (Kumamoto, Japan), Tatsuaki Kozono (Kusatsu, Japan) and Takaaki Yamada (Kusatsu, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "The temperature threshold determining device includes a temperature data storage unit, a representative temperature value determining unit, and a temperature threshold determining unit. The temperature data storage unit stores temperature data that indicates the te...