US Patent Issued to OMRON on July 29 for "Model generation apparatus, regression apparatus, model generation method, and computer-readable storage medium storing a model generation program" (Japanese Inventors)

ALEXANDRIA, Va., July 30 -- United States Patent no. 12,374,095, issued on July 29, was assigned to OMRON Corp. (Kyoto, Japan).

"Model generation apparatus, regression apparatus, model generation method, and computer-readable storage medium storing a model generation program" was invented by Tatsunori Taniai (Tokyo) and Ryo Yonetani (Tokyo).

According to the abstract* released by the U.S. Patent & Trademark Office: "A model generation apparatus trains, through machine learning, a neural network module that includes an extraction operation to extract an element satisfying a predetermined condition from a set of targets. In the machine learning, the model generation apparatus performs the extraction operation in a phase of forward propagati...