ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,498,271, issued on Dec. 16, was assigned to OMRON Corp. (Kyoto, Japan).
"Temperature abnormality detection device" was invented by Ryo Ikeuchi (Otsu, Japan), Koji Takatori (Moriyama, Japan), Takahiro Nakamura (Ritto, Japan), Hironori Ogawa (Kyoto, Japan), Tadahiko Ogawa (Ritto, Japan) and Akira Takaishi (Moriyama, Japan).
According to the abstract* released by the U.S. Patent & Trademark Office: "A temperature abnormality detection device includes a plurality of infrared temperature sensors respectively capable of detecting temperature in a different detection area of an equipment, and a device body including a temperature abnormality determination unit that determines that the tempe...