US Patent Issued to OMRON on April 15 for "Abnormality detecting device, abnormality detecting method, and storage medium" (Japanese Inventors)

ALEXANDRIA, Va., June 5 -- United States Patent no. 12,276,975, issued on April 15, was assigned to OMRON Corp. (Kyoto, Japan).

"Abnormality detecting device, abnormality detecting method, and storage medium" was invented by Kazuhiro Takeda (Kyoto, Japan), Shota Sakashita (Kyoto, Japan) and Naoya Hashimoto (Kyoto, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An abnormality in a device of interest is detected on the basis of the distance from a predetermined reference curve to a point represented by a first index value and a second index value in a two-dimensional plane having the first index and the second index as axes."

The patent was filed on Feb. 28, 2020, under Application No. 17/621,685.

*For...