US Patent Issued to OMNIVISION TECHNOLOGIES on Dec. 16 for "Event vision sensors with defect pixel suppression, including event vision sensors with in-pixel defect pixel suppression based on noise event occurrence firing rates, and associated systems, devices, and methods" (Chinese, American Inventors)

ALEXANDRIA, Va., Dec. 16 -- United States Patent no. 12,501,184, issued on Dec. 16, was assigned to OMNIVISION TECHNOLOGIES INC. (Santa Clara, Calif.).

"Event vision sensors with defect pixel suppression, including event vision sensors with in-pixel defect pixel suppression based on noise event occurrence firing rates, and associated systems, devices, and methods" was invented by Andreas Suess (San Jose, Calif.), Menghan Guo (Shanghai) and Shoushun Chen (Shanghai).

According to the abstract* released by the U.S. Patent & Trademark Office: "Event vision sensors with defect pixel suppression (and associated methods) are disclosed herein. In one embodiment, an event vision sensor includes an array of event vision pixels and an event signal p...