US Patent Issued to OLYMPUS on July 1 for "Eccentricity measurement method and eccentricity measurement device" (Japanese Inventor)

ALEXANDRIA, Va., July 3 -- United States Patent no. 12,345,594, issued on July 1, was assigned to OLYMPUS Corp. (Tokyo).

"Eccentricity measurement method and eccentricity measurement device" was invented by Yosuke Sato (Hachioji, Japan).

According to the abstract* released by the U.S. Patent & Trademark Office: "An eccentricity measurement method includes first to eighth steps. In the first step, an eccentricity measurement device for relatively linearly moving an optical image for measurement to an optical unit under test and acquiring an image on an observed surface orthogonal to a reference axis defined by a relative movement trajectory of the optical image is provided. In the second step, a position of a reference point is identified....