ALEXANDRIA, Va., Nov. 11 -- United States Patent no. 12,467,946, issued on Nov. 11, was assigned to okins electronics Co. Ltd (Gyeonggi-Do, South Korea).
"Test socket" was invented by Jin Kook Jun (Gyeonggi-do, South Korea), Chan Ho Lee (Gyeonggi-do, South Korea) and Jae Hyun Seo (Gyeonggi do, South Korea).
According to the abstract* released by the U.S. Patent & Trademark Office: "A test socket is provided. According to an aspect of the present invention, provided is a test socket energizably connected to a semiconductor device to electrically test the semiconductor device, the test socket including a base on which a seating part on which the semiconductor device is seated is formed and a test pin protruding from the seating part in one ...