ALEXANDRIA, Va., June 19 -- United States Patent no. 12,332,159, issued on June 17, was assigned to Ocean University of China.
"Test device applied to coupled environment of stress, wear, and corrosion, and quantitative evaluation method" was invented by Hongzhi Cui (Qingdao, China), Hongwei Zhang (Qingdao, China), Guoliang Ma (Qingdao, China), Hao Chen (Qingdao, China) and Xiyan Lin (Qingdao, China).
According to the abstract* released by the U.S. Patent & Trademark Office: "This application relates to a test device applied to a coupled environment of stress, wear, and corrosion, and a quantitative evaluation method, and belongs to the field of failure analysis of materials. The test device includes a stress-loading mechanism configured ...