US Patent Issued to NXP USA on March 4 for "Differential input receiver circuit testing with a loopback circuit" (American, French Inventors)

ALEXANDRIA, Va., March 5 -- United States Patent no. 12,244,331, issued on March 4, was assigned to NXP USA Inc. (Austin, Texas).

"Differential input receiver circuit testing with a loopback circuit" was invented by Kumar Abhishek (Bee Cave, Texas), Srikanth Jagannathan (Austin, Texas) and Frederic Benoist (Saint Paul de Vence, France).

According to the abstract* released by the U.S. Patent & Trademark Office: "A low voltage differential signaling (LVDS) receiver includes a receiver circuit including first and second inputs coupled to first and second conductive pads, respectively, and an output coupled to an input of a digital controller, and a dummy transmitter circuit including a first input coupled to receive a common mode voltage (VC...