ALEXANDRIA, Va., Jan. 28 -- United States Patent no. 12,535,368, issued on Jan. 27, was assigned to NXP USA Inc. (Austin, Texas).
"Apparatus for determining temperature" was invented by Thierry Michel Alain Sicard (Auzeville tolosane, France).
According to the abstract* released by the U.S. Patent & Trademark Office: "An apparatus for determining temperature including a PTAT circuit configured to provide a PTAT voltage proportional to absolute temperature, a bandgap voltage reference circuit configured to generate a voltage across a sense-resistor wherein a reference voltage is provided between a first terminal and a second terminal which couple to the sense-resistor, and a calibration circuit, including a memory to store a predetermined ...