US Patent Issued to NXP USA on Jan. 13 for "Physical-aware power profile optimization during memory test" (Texas Inventors)

ALEXANDRIA, Va., Jan. 13 -- United States Patent no. 12,524,323, issued on Jan. 13, was assigned to NXP USA Inc. (Austin, Texas).

"Physical-aware power profile optimization during memory test" was invented by Ke Zhang (Dripping Springs, Texas), Henning Fritz Spruth (Austin, Texas), Qadeer Qureshi (Dripping Springs, Texas), Christopher Michael Falk (Dripping Springs, Texas) and Rajesh Padinzhara Rajan (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "A method for physical-aware power profile optimization during memory test includes creating a plurality of scheduling buckets, wherein each scheduling bucket includes one or more sequentially executed test sequences, each test sequence controlled by a...