ALEXANDRIA, Va., Dec. 31 -- United States Patent no. 12,510,617, issued on Dec. 30, was assigned to NXP USA Inc. (Austin, Texas).
"Current measurement system and method" was invented by Trevor Mark Newlin (Mesa, Ariz.).
According to the abstract* released by the U.S. Patent & Trademark Office: "A current measurement system and a corresponding method are described, where the current measurement system includes a resistor structure having a sense resistor and a calibration resistor where a single metal layer of the resistor structure includes the sense resistor and the calibration resistor, calibration circuitry configured to provide a calibration current through the calibration resistor, and sense amplifiers configured to measure respectiv...