US Patent Issued to NXP on Sept. 23 for "Apparatuses and methods for faciliatating a dynamic clock frequency for at-speed testing" (Indian Inventors)

ALEXANDRIA, Va., Sept. 23 -- United States Patent no. 12,422,482, issued on Sept. 23, was assigned to NXP B.V. (Eindhoven, Netherlands).

"Apparatuses and methods for faciliatating a dynamic clock frequency for at-speed testing" was invented by Chandan Gupta (Greater Noida, India), Satish Chandra Tiwari (Noida, India) and Abhishek Ashok Bajpaee (Vadodara, India).

According to the abstract* released by the U.S. Patent & Trademark Office: "Aspects of the subject disclosure may include, for example, monitoring first data to identify a first plurality of test points, analyzing the first plurality of test points to identify the first data as being associated with a first time domain included in a plurality of time domains, wherein respective po...