US Patent Issued to NXP on Nov. 4 for "System and method for improving safety of integrated circuits" (Indian, American, German Inventors)

ALEXANDRIA, Va., Nov. 6 -- United States Patent no. 12,462,850, issued on Nov. 4, was assigned to NXP B.V. (Eindhoven, Netherlands).

"System and method for improving safety of integrated circuits" was invented by Rishi Bhooshan (Greater Noida, India), Hubert Martin Bode (Haar, Germany), Shilpa Gupta (Delhi, India) and Alexander Hoefler (Austin, Texas).

According to the abstract* released by the U.S. Patent & Trademark Office: "An integrated circuit (IC) for detecting single event latch-ups (SELs) includes a plurality of wells of a memory circuit and a detection circuit. The detection circuit includes a selection circuit, a comparison circuit, and a fault collection and control management circuit. The selection circuit selects a well of th...